Failure Analysis Equipment Market, By equipment (Scanning electron microscope (SEM), Transmission electron microscope (TEM), Focused Ion Beam system (FIB), and Dual - Beam (FIB/SEM) systems), By technology (Focused ion beam (FIB), Broad ion milling (BIM), Secondary ion mass spectroscopy (SIMS), Energy dispersive X-ray spectroscopy (EDX), Reactive ion etching (RIE), and Chemical mechanical planarization (CMP)), By end-use (Semiconductors manufacturing, Fiber optics, Bio-medical and life sciences, Metallurgy, Nanotechnology and nanomaterial’s, and Polymers), By Region (North America, Latin America, Europe, APAC, RoW) - Size, Share, Outlook, and Opportunity Analysis, 2022 - 2030
Select a license type that suits your business needs
Single User License
US$ 4,500
US$ 3,500
Three thousand five hundred dollars
Frequently purchased
Multi User License
US$ 7,000
US$ 5,500
Five thousand five hundred dollars
Corporate User License
US$ 10,000
US$ 7,500
Seven thousand five hundred dollars
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